Nano Focus X-ray Inspection System Quadra7Pro Nordson
The latest X-ray inspection device equipped with next-generation dual-mode tubes.
The Quadra7 Pro has further improved the conventional maintenance-free shielded transmissive type X-ray tube and is equipped with the industry's first dual mode. It can accommodate a wider range of applications, from power devices to wafer inspection, and by combining it with our latest generation Onyx flat panel developed in-house, it has further reduced noise and enhanced performance.
basic information
Latest state-of-the-art flat panel Onyx detection developed in-house - Reduction of X-ray noise - Improved image quality - Low leakage - Allows for long integration times - Image capture with minimal power - Reduces the required number of integrations - Speeding up readout - Expands dynamic range through averaging - No whiteout even with high power irradiation New [REVOLUTION] software The user interface has been completely revamped, allowing for operation as if using a smartphone Maximizing ease of use! - Simple and intuitive menu and control bar - Screen layout can be personalized for each operator ID - Smoother workflow - Simple point-and-click operation with just one mouse - Easy creation of automatic inspection routines High-resolution Ultra Wide curved monitor - Fully compatible with the workflow of Revalution software - Seamless and stress-free screen display - 1:1 detection resolution between the detector and screen - Height adjustable with an ergonomic monitor arm
Price range
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Applications/Examples of results
Inspection of fine details such as semiconductors: FO-WLP, filling and voids of 3D packages and TSV, micro bumps, Cu pillar size, and void measurement. Packaging: Assembly & IC package memory, CPU/GPU, wire bonding. Automotive: Inspection of wear and fatigue cracks in automotive parts. Inspection of solder quality for electronic components and PCBA (IPCA-610), BGA (IPC-7095).
