[Data] Real-time Measurement Particle Counter
Building a particle management system linked to the coating machine!
This document introduces real-time measurement particle counters. It includes the current concepts of particle counters (OPC) in the deposition industry, key factors for improving appearance quality, the size of defects required for optical films in recent years, and the sizes of contaminants that should be managed in thin film coatings. Please utilize this information when using particle counters. 【Contents (excerpt)】 ■ Current concepts of particle counters (OPC) in the deposition industry ■ Key factors for improving appearance quality ■ For appearance improvement… ■ Measurement examples ■ The size of defects required for optical films in recent years *For more details, please refer to the PDF document or feel free to contact us.
basic information
【Other Published Content (Excerpt)】 ■Impact of contaminant size in thin films on the surface ■Contaminant size on substrates calculated from required levels ■Contaminant sizes to be managed in thin film coatings ■Particle size of contaminants to be managed ■Behavior of large particle size contaminants? *For more details, please refer to the PDF document or feel free to contact us.
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Applications/Examples of results
For more details, please refer to the PDF document or feel free to contact us.
