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No scanning stage required. High-speed thickness/distance measurement sensor (area scanner) with a maximum measurement range of 12 inches.
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Surface roughness measurement - Comparison report with contact measurement results - CHRocodile CHRocodile color aberration confocal sensor
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Case Study Collection: Thickness Measurement and 3D Shape Measurement of Semiconductor Wafers Using Non-Contact Sensors
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Collection of Measurement Examples: Application of Non-contact Sensors in Semiconductors - Thickness Measurement - Flatness Management
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Introduction to the application of the non-contact 3D shape measurement line sensor CLS - A non-contact, high-speed optical sensor.
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Proposal for Non-Contact Wafer Thickness Measurement Sensor During In-Process for Semiconductors
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[Information] Application examples and proposals for products related to the manufacturing process of consumer electronics.
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![[Information] Focus Monitoring Applications and Proposals in Laser Welding](https://image.mono.ipros.com/public/catalog/image/01/742/506930/IPROS49730221677707274074.jpeg?w=120&h=170)
![[Information] Application examples and proposals for products related to the manufacturing process of consumer electronics.](https://image.mono.ipros.com/public/catalog/image/01/8b2/506929/IPROS04849050861200650810.jpeg?w=120&h=170)
![[Information] Introduction to the CHRocodile Series](https://image.mono.ipros.com/public/catalog/image/01/5ec/491418/IPROS37932654896211512346.jpeg?w=120&h=170)
![[Data] Precitec Presentation: Measurement Examples for Semiconductors](https://image.mono.ipros.com/public/catalog/image/01/bfd/491415/IPROS89253026521490950088.jpeg?w=120&h=170)
