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3.5 GHz TD-LTE Band 42 GCF certification supported
Rohde & Schwarz GmbH (Headquarters: Munich, Germany) announced on January 28, 2016, that it has been recognized as the first T&M equipment manufacturer to meet the certification initiation conditions (TPAC) for the 3.5 GHz TD-LTE band 42 test platform. The R&S CMW500 protocol tester, R&S TS8980 RF performance test system, and R&S TS-RRM test system have been acknowledged by the Global Certification Forum (GCF) as being capable of verifying over 80% of the test cases related to mobile device certification, corresponding to GCF WI-090-42, WI-091-42, and WI-092-42. Major network operators in Japan have already obtained the license for the 3.5 GHz TD-LTE band 42, which is part of the European R&TTE directive EN 301 908 v7.0.1, and are preparing for service launch within the year.
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The world's first, R&S TS8980FTA-2 certified as a conformance test system for LTE uplink carrier aggregation.
Rohde & Schwarz Japan Co., Ltd. (Headquarters: Shinjuku, Tokyo, Representative Director: Jacques Jourda) announced on February 9, 2016, that the R&S TS8980FTA-2 has been certified as the only test system capable of supporting all conformance tests related to GCF TDD uplink carrier aggregation (CA UL). Manufacturers of mobile terminals, chipset vendors, and test houses can use this system to certify CA UL implementations in accordance with the test specifications of 3GPP TS 36.521-1.
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R&SCMW WLAN/Bluetooth test platform certified by Broadcom
Rohde & Schwarz's test equipment meets Broadcom's stringent measurement requirements and provides valid test results for quality control and production prototyping. Rohde & Schwarz has obtained a license for Broadcom's manufacturing test license program. This program enables Rohde & Schwarz to develop software capable of performing calibration and verification sequences for Broadcom chipsets.
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Agreement on a collaborative system to enhance solutions for SDN/NFV applications between Napatech and Ipoque.
Napatech, a leading supplier of network management and security application analysis accelerators, and Ipoque (Rohde & Schwarz), a top provider of deep packet inspection (DPI) solutions, have announced a collaboration to develop solutions that provide insights for high-speed and real-time applications to support mobile networks that require high agility and flexibility. The increase in mobile network users necessitates a reduction in the time to introduce new services and the construction of real-time and more secure networks to meet growing demand. Cost reduction for network construction is also a significant challenge. To meet these demands, networks and services utilizing SDN technology, which allows for centralized network management, and NFV technology, which virtualizes network functions to run on general-purpose servers, are being employed. Through this collaborative framework, we will provide solutions that offer rapid and real-time insights into networks and services using SDN/NFV technologies.
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Rohde & Schwarz "Supports Signal Generation/Analysis for Verizon 5G Open Trial Specifications"
Rohde & Schwarz Japan Co., Ltd. (Headquarters: Shinjuku, Tokyo, Representative Director: Jacques Jourda) announced on September 21, 2016, that the Rohde & Schwarz headquarters has supported 5G signal generation/analysis based on the specifications required by Verizon's Open Trial specifications. By using the Vector Signal Generator R&S SMW200A and the Signal Spectrum Analyzer R&S FSW, it was demonstrated that EVM measurements can be achieved at less than 1% for Verizon's 5G specifications. When evaluating DUTs such as power amplifiers that require new development for the centimeter waveband, the measuring instruments themselves can sometimes affect the measurement results. Regarding this issue, the Rohde & Schwarz R&S SMW200A and R&S FSW demonstrated exceptionally high performance. These measuring instruments were able to consistently maintain EVM below 1% even during a wide power sweep of 10 dB when measuring 5G signals at 28 GHz, confirming that these measuring instruments do not influence the EVM measurement results of the DUT.