Customized Inspection Device "SIM 3000"
Supports large workpieces such as 300mm×300mm size! Customizable base model.
The "SIM 3000" is a base model of a customizable inspection device that can be tailored to meet various customer requirements. It automatically detects foreign objects, defects, scratches, and unevenness at a size of 1μm. Equipped with both micro and macro inspection units, it can accommodate various inspections and, with its multifunctionality, allows for inspection reviews and verification of processing areas, enabling the construction of a system tailored to the customer's objectives. 【Features】 ■ Supports large workpieces such as 300mm x 300mm ■ Automatically detects foreign objects, defects, scratches, and unevenness at a size of 1μm ■ Capable of generating highly accurate mapping data and defect lists ■ Various functions can be customized according to customer requests ■ Equipped with micro and macro inspection units *For more details, please refer to the PDF document or feel free to contact us.
basic information
【Other Features】 ■Model 3001 (Micro Inspection): Pursuing automation and speedup of ultra-high precision inspection at microscope magnification ■Model 3002 (Micro Zoom Inspection): Electric zoom micro microscope inspection device ■Model 3003 (Macro Inspection): Low magnification wide field inspection *For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
【Applications】 ■Model 3001: Internal defect inspection ■Model 3002: Transparent electrode pattern inspection ■Model 3003: Macro pattern/particle inspection *For more details, please refer to the PDF document or feel free to contact us.
