Special feature on optimal solutions for the characteristic evaluation of optoelectronic fusion devices.
Evaluation solution to accelerate SiPh/PIC development.
This product line is a measurement solution that enables high-speed and high-precision characterization and defect analysis in the development of silicon photonics (SiPh) and photonic integrated circuits (PIC). In the development of optoelectronic fusion devices, it is crucial to determine "how quickly measurement results can be fed back into development." By accurately evaluating various optical characteristics and quickly identifying issues, it contributes to improving development efficiency. In addition to WDL and PDL characteristics, it is also possible to measure the reflection positions inside the device using OFDR technology, allowing for the identification of loss occurrence points.
basic information
Examples of equipment required for each measurement solution 1. Insertion Loss (IL) / Wavelength Dependent Loss (WDL) / Polarization Dependent Loss (PDL) Measurement - Wavelength Variable Light Source TSL-775 or TSL-570 - Polarization Control Unit PCU-110 - Multi-Port Optical Power Meter MPM-220 2. Reflection Point / Waveguide Propagation Loss Measurement - Wavelength Variable Light Source TSL-775 or TSL-570 - Wavelength Swept Photonics Analyzer SPA-110 For details, click here "https://youtu.be/tNUDoUE6300?si=9oP0MdVVeY9O_GeK" 3. Multi-Port Measurement (1) 1 x N Device - Wavelength Variable Light Source TSL-775 or TSL-570 - Multi-Port Optical Power Meter MPM-220 (2) N x M Device - Stabilized Light Source SLS-200 - Optical Switch OSX-100 - Multi-Port Optical Power Meter OPM-200 4. Emulation of ROADM Network - Optical Filter OTF-980 or WSS-2000
Price range
Delivery Time
Model number/Brand name
TSL-570/MPM-220/SPA-110/OTF-980/WSS-2000/OSX-100/OPM-200/SLS-200
Applications/Examples of results
This solution is widely used for research and development, design verification, and manufacturing purposes. - Internal structure analysis of SiPh chips and organic devices - Q-factor evaluation of SiPh ring resonators - WDL/PDL/waveform evaluation and testing of couplers and filters - Simultaneous multi-channel measurements such as WSS (High-precision evaluation of design variations is possible through batch measurements under the same conditions) and more.
Related Videos
catalog（20）
Download All Catalogs
Recommended products
Distributors
Santec has been manufacturing optical components, laser products, and optical measuring instruments for over 40 years, responding to the stringent quality demands of our customers in the optical industry. Additionally, by constantly seeking innovation and meeting customer requests, Santec has introduced numerous new optical-related products to the market. Our journey towards the creation of the ideal world of light, "OPTOPIA," which is our management philosophy, also involves minimizing the timeline from product concept to commercialization.