X-ray microanalysis software "Pathfinder"
Improving electron microscope analysis! It excels in discovering the properties of unknown materials and foreign substances.
"Pathfinder" is a new tool designed to achieve efficient and comprehensive electron microscope analysis. It allows for the detection of trace elements in extremely complex matrices by scanning spectral imaging data at the pixel level. Our proprietary 29 types of imaging filters enhance the clarity and comprehensibility of SEM/EDS and SEM/WDS data images. 【Features】 ■ Achieves efficient and comprehensive electron microscope analysis ■ Prevents prolonged and subjective analysis ■ Reliable analysis can be completed in less than one minute ■ Excellent for discovering the properties of unknown materials and foreign substances ■ Capable of detecting trace elements in extremely complex matrices *For more details about the product, please contact us directly.
basic information
【Other Features】 ■ "Quick Start" mode and power mode that responds to user feedback ■ Automatic peak identification and quantification, whether using standard samples or not ■ Real-time calculation and display of quantification maps from collected data ■ Supports 2D and 3D mosaic functions in batch extraction ■ Fully automated programs provide consistently high-precision analytical results *For product details, please contact us directly.
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