Quasor II EBSD System
Introducing an electron backscatter diffraction analysis device that easily allows for simultaneous collection of EBSD data and EDS/WDS spectral images!
The "Quasor II EBSD System" is an electron backscatter diffraction analysis device that allows for the simultaneous collection of EBSD data and EDS/WDS spectral images with ease. It characterizes the crystal structures that influence the physical properties of a wide range of materials observed through scanning electron microscopy (SEM) and microanalysis. You can obtain both structural and chemical information of the sample in a single measurement. 【Features】 ■ Collection speed of up to 600 frames per second with 99% of pixels indexed ■ Obtain both structural and chemical information of the sample in a single measurement ■ Background removal through subtraction or division ■ Image cropping ■ Flat fielding using FFT or parabolic methods *For more details about the product, please contact us directly.
basic information
【Other Features】 ■ Select up to 30 detection target bands ■ Image normalization based on line length or Huff background ■ Huff filtering using sharp images, balanced images, or smoothed images ■ Huff clip diameter adjustment for screen pattern quality ■ Huff transform display with editable line selection *For product details, please contact us directly.
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