検査・計測／可視化
検査・計測／可視化
製造現場や品質管理で用いられる検査・計測・可視化技術を掲載するカテゴリです。 外観検査、光学検査、波形判定など、人手に頼っていた検査工程の自動化・高度化を実現します。
1～6 item / All 6 items
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Curved Surface Correspondence / Micro Defect Inspection Optical Inspection Technology OneShotBRDF
It does not miss tiny scratches and foreign objects with a depth of a few micrometers. Defect detection, which relied on visual inspection, is captured and detected in one shot using our unique scattered light detection technology!
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Waveform Characteristic Evaluation Assist Tool Waveform Insight
AI explains the causes and countermeasures for oscilloscope waveform anomalies. A waveform characteristic evaluation assist tool to streamline evaluation and analysis.
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Oscilloscope Automatic Judgment: Waveform Characteristic Automatic Judgment Tool
Automatic judgment of waveform characteristics obtained with an oscilloscope using AI! Automating the visual judgment work of engineers with "Waveform meister."
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Inheritance of skilled technicians' know-how through AI: A tool for supporting the analysis of waveform anomalies.
AI assists with the "why?" of waveform evaluation, providing support not only for the detection of waveform anomalies but also for estimating the causes of anomalies and considering countermeasures.
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"Detecting fine scratches and defects in one shot" Optical inspection technology
Difficult-to-detect fine scratches and defects are detected in one shot using our unique optical technology.
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Automating LSI evaluation and waveform checks using AI waveform judgment.
Automatic judgment of oscilloscope waveforms using AI. Reducing the burden of visual confirmation and streamlining LSI evaluation "Waveform meister."
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