Fine Tech Japan Specialized Technology Seminar "Chromaticity and Uniformity Inspection in Micro LED"

テクノオプティス（旧株式会社トプコンテクノハウス）

At the 28th Fine Tech Japan (LCD, Organic EL, Sensor Technology Exhibition) specialized technical seminar, I will also be giving a presentation. As μLED is becoming the mainstream device to meet the expanding display's color gamut and contrast, the uniformity of brightness and chromaticity has become an issue due to the intensification of self-emission. The world's first developed two-dimensional spectral radiance meter, SR-5000, can analyze subpixels smaller than 2um! In this presentation, I will introduce examples. ■ "Chromaticity and Uniformity Inspection in Micro LED" Presentation December 7 (Friday) 9:30–10:20 Optical Measurement Department Sales Group Manager Kazuto Nishikawa We sincerely look forward to your attendance!

Date and time Friday, Dec 07, 2018
09:30 AM ～ 10:20 AM
Capital Makuhari Messe FTJ-13
Entry fee Charge

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