Capacitive Non-contact Displacement Sensor PS-IA
Catalog available! Non-contact displacement gauge that can measure in nanometers stably.
The PS sensor is an ultra-precise non-contact displacement meter that employs a unique capacitive method, achieving high stability, high resolution, and versatility. It is used in a wide range of fields such as displacement, vibration, shape, and position detection, and has received high praise as a general-purpose displacement meter that pursues cost performance. Additionally, considering the impact on the global environment, all products comply with lead-free and RoHS directives. We have accumulated many achievements as a high-performance tool with applicability in research and development fields, as well as integration into semiconductor-related devices and electronic equipment. We will make suggestions based on your usage environment. Please feel free to contact us. ***************************************************** We offer a free comprehensive catalog from Unipulse that includes details about the PS-IA. If you are interested, please feel free to contact us. ***************************************************** 【NanoTex Co., Ltd. has merged with Unipulse Corporation.】
basic information
This is a single-channel amplifier that operates on AC100V or DC24V, featuring a zero output reset function, NEAR/FAR LED indicators, and BNC analog output. It is a compact yet multifunctional system suitable for various applications, from research and development to integration into various devices. ■ Main Features ○ A wide lineup with a standard measurement range of 30μm to 10000μm ○ Sensitivity does not change depending on the material if it is a conductor ○ Not affected by surface roughness ○ High linearity: within ±0.05% ○ Low noise: below 0.002%/FS (rms) ★☆ Free demo available ☆★ We will promptly visit for a demonstration upon request. Please feel free to contact us.
Price information
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Delivery Time
Applications/Examples of results
■ Application Examples Surface profile measurement Thickness and flatness measurement Stage transfer amount measurement, positioning control Closed-loop control of piezo stages Brake disc wear measurement Wafer thickness, flatness, and planarity measurement Runout measurement of rotating bodies Autofocus sensor for microscope objective lenses
