Contact probe

Support for micro-machining at the φ0.05 level! A consistent manufacturing system from high-precision machining to surface treatment.

last updated Dec 16, 2025

Contact probe components for semiconductor electrical testing | ±0.005mm processing

Supports from a minimum diameter of φ0.05mm to mass production of tens of thousands of units. Contributes to quality stability and yield improvement in semiconductor testing with high-precision micro-machining of ±0.005mm.

last updated Feb 20, 2026