We have released the presentation materials for the Boundary Scan Public Research Meeting. "Hybrid Testing of Flying Probe Testers and JTAG Testing."

TAKAYA Corporation株式会社
On September 25th (Monday), a Boundary Scan Public Research Meeting (online seminar) was held, where Mr. Taniguchi from Andor System Support Co., Ltd. and Mr. Yanagida from Takaya Co., Ltd. gave a joint presentation. The presentation materials from that event have been made public, so please take a look at the related catalog pages below. Agenda: - Trends in high-density printed circuit boards - Basic technology of JTAG boundary scan - Basic technology of flying probe testers - Hybrid testing to complement test coverage - Hybrid inspection of flying probe + boundary scan

