We will be exhibiting at the 36th NePCON Japan - Electronics Development and Implementation Exhibition. [e-invitation tickets are available for download (free)]

We are pleased to announce that our company will be exhibiting at "NEPCON Japan," one of the largest electronics development and implementation exhibitions in Asia, to widely introduce our high-performance flying probe testers. At our booth, we will be showcasing the "APT-1600FD," which supports simultaneous inspection of both sides of a circuit board with four-axis top and two-axis bottom contact, making its debut in Japan. You will be able to confirm its actual inspection performance. We understand that you may be busy, but we sincerely invite you to visit us. 36th NEPCON Japan https://www.nepconjapan.jp/ Exhibition Name: 36th ElectroTest Japan - Electronics Inspection, Testing, and Measurement Exhibition - Our Booth Number: Hall 3, 17-54 Our Exhibited Products: Dual-Sided Flying Probe Tester "APT-1600FD" Flying Probe Tester "APT-1640J"


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