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1~13 item / All 13 items
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From colorless to colored, adapting to changes in inspection! An exceptionally scalable surface defect inspection device.
For those struggling with the transition to color inspection or the addition of cameras in the future! We solve this with high expandability and four times the processing power, reducing the risk of future line changes.
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Color Inline Inspection Device "AIRIS CLOTH"
Inspection utilizing the features of both color and monochrome.
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SCI-SE
Simple color testing device
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Inline inspection device "FITS-IV series"
Wide-ranging support from simple inspections such as inspection machines to comprehensive inline inspections.
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Offline inspection device "MICRO ACE series"
Customizable! A lineup of offline inspection devices capable of high-resolution testing.
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Inline inspection device "AIRIS ACE series"
Emphasizing ease of use and expandability! A surface defect inspection device that can adapt flexibly to meet your needs!
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Inline inspection device "CONTACT ACE series"
Automatic mask setting at slit positions! A close-up surface defect inspection device that reduces inspection labor!
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Microwave Metal Inspection Device
Detect conductive materials with microwaves to prevent foreign matter contamination! Two types available!
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Collaborative Project Product Series
Your expertise" × "Our technological capabilities" to realize "the one machine you were looking for!
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Electrode Sheet Inspection Device (Elins) eLINS
Surface Defect Detection Device Series
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Ultra-compact label marker AMK-Mini
Low price, compact design, suitable for difficult-to-install locations! Ultra-compact label marker.
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Label marker (compatible with low, medium, and high-speed lines)
Label marker (compatible with low, medium, and high-speed lines)
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Marking device "AMK-S1"
Marking device "AMK-S1"
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