JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope
We have adopted our new concept colors, Pure White and JEOL Silver, resulting in a more refined form design.
NEOARM, developed by Japan Electron Optics Corporation, is equipped with a cold field emission electron gun (Cold-FEG) developed with our unique technology and a new spherical aberration corrector (ASCOR) capable of correcting up to higher-order aberrations, enabling atomic resolution observation not only at a high acceleration voltage of 200 kV but also at a low acceleration voltage of 30 kV. Additionally, we have developed our proprietary aberration correction algorithm and incorporated a system that automatically performs fast and accurate aberration correction. This provides high-throughput atomic resolution observation. 〇 Features - Spherical aberration corrector ASCOR (Advanced STEM corrector) - Automatic aberration correction software JEOL COSMO (Corrector System Module) - New ABF (Annular Bright Field) detector system - Perfect sight detector *For more details, please download the PDF or feel free to contact us.
basic information
【Specifications】 Resolution※1 STEM HAADF Image: 70pm (200kV), 100pm (80kV), 160pm (30kV) TEM Information Limit: 100pm (200kV), 110pm (80kV), 250pm (30kV) Electron Gun: Cold Cathode Field Emission Electron Gun - Standard Equipment ※1 In the case of a STEM/TEM spherical aberration correction system with UHR (Ultra High Resolution Pole Piece) ■ For more details, please refer to the PDF or feel free to contact us.
Price information
Please contact us.
Price range
P9
Delivery Time
P4
It may vary depending on the delivery area, so please feel free to contact us.
Model number/Brand name
JEM-ARM200F NEOARM
Applications/Examples of results
【Purpose】 Atomic resolution observation
