Ion beam application device
Ion beam application device
This is an introduction to ion beam application devices.
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IB-19520CCP Cross-Section Sample Preparation Device
By cooling the sample with liquid nitrogen during processing, it is possible to reduce thermal damage caused by the ion beam.
last updated
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JIB-4700F Composite Beam Processing Observation Device
Achieved a guaranteed resolution of 1.6 nm at a low acceleration voltage of 1 kV.
last updated