IB-19520CCP Cross-Section Sample Preparation Device
By cooling the sample with liquid nitrogen during processing, it is possible to reduce thermal damage caused by the ion beam.
The Japan Electronics Corporation IB-19520CCP Cooling Cross-Section Polisher sample preparation device can reduce thermal damage from ion beams by cooling the sample with liquid nitrogen during processing. It has a long cooling retention time and is designed to minimize liquid nitrogen consumption. 〇 Features - Allows for rapid cooling, room temperature recovery, and removal of the sample while keeping liquid nitrogen inside. - Equipped with a transport mechanism to perform processing to observation in a non-atmospheric exposure environment. - Automatic processing program. - Multi-purpose stage. *For more details, please download the PDF or feel free to contact us.
basic information
【Specifications】 Model: IB-19520CCP Ion acceleration voltage: 2 to 8 kV Milling speed: 500 μm/h or more (at acceleration voltage of 8 kV) *1 Sample swing function: ±30° automatic swing *For more details, please refer to the PDF or feel free to contact us.
Price information
Please contact us.
Delivery Time
Model number/Brand name
IB-19520CCP
Applications/Examples of results
[Application] Processing of various samples such as low melting point metals, composite materials, metals, glass, and ceramics.
