断面試料作製装置
断面試料作製装置
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IB-19520CCP Cross-Section Sample Preparation Device
By cooling the sample with liquid nitrogen during processing, it is possible to reduce thermal damage caused by the ion beam.
最終更新日
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IB-19530CP Cross-Section Polisher Section Sample Preparation Device
Achieving multifunctionality by replacing the functional holder.
最終更新日