IB-19530CP Cross-Section Polisher Section Sample Preparation Device
Achieving multifunctionality by replacing the functional holder.
Japan Electronics Co., Ltd. IB-19530CP Cross-Section Polisher Sample Preparation Device has adopted a multi-purpose stage to meet the diversifying market needs, achieving multifunctionality by exchanging various functional holders. By selecting functional holders according to the application, it can expand its capabilities not only for cross-section milling but also for planar milling, ion beam sputter coating, and more. 〇Features - Automatic processing program - Multi-purpose stage *For more details, please download the PDF or feel free to contact us.
basic information
【Specifications】 Model: IB-19530CP Ion acceleration voltage: 2 to 8 kV Milling speed: 500 μm/h or more (at acceleration voltage of 8 kV) Sample swing function: ±30° automatic swing *For more details, please download the PDF or feel free to contact us.
Price information
Please contact us.
Delivery Time
Model number/Brand name
IB-19530CP
Applications/Examples of results
【Purpose】Preparation of cross-sectional samples for SEM
