JSM-IT800 Field Emission Scanning Electron Microscope
It is expected that information that has not been obtained until now can be acquired, and improvements can be made to the measurements that are causing difficulties.
Japan Electron Co., Ltd. JSM-IT800 Field Emission Scanning Electron Microscope features a "In-Lens Schottky Plus Field Emission Electron Gun" for achieving high-resolution observation, a next-generation electron optical control system "Neo Engine," and a GUI "SEM Center" developed for high-speed elemental mapping, all integrated with our proprietary EDS on a common platform. By replacing the objective lens of the SEM with a modular design, we provide equipment tailored to various needs. 〇 Features - In-Lens Schottky Plus Field Emission Electron Gun (FEG) - Equipped with a next-generation electron optical control system that incorporates the essence of JEOL's electron optical technology - SEM Center and EDS integration - SMILE VIEW Lab - Smile Navigation *For more details, please download the PDF or feel free to contact us.
basic information
【Specifications】 Version ・HL version / is version / i version / SHLs version / SHL version Resolution ・HL version: 0.7nm (20kV), 1.3nm (1kV), 3.0nm (15kV, 5nA, WD 10mm) ・is version: 0.6nm (15kV), 1.0nm (1kV), 3.0nm (15kV, 5nA, WD 8mm) ・i version: 0.5nm (15kV), 0.7nm (1kV), 3.0nm (15kV, 5nA, WD 8mm) ・SHLs version: 0.6nm (15kV), 1.1nm (1kV), 3.0nm (15kV, 5nA, WD 10mm) ・SHL version: 0.5nm (15kV), 0.7nm (1kV), 0.9nm (500V), 3.0nm (5kV, 5nA, WD 10mm) *For more details, please download the PDF or feel free to contact us.
Price information
Please contact us.
Price range
P8
Delivery Time
OTHER
Delivery areas may vary. Please feel free to contact us.
Model number/Brand name
JSM-IT800
Applications/Examples of results
【Applications】 HL version: Magnetic materials, wide-area EBSD is/i version: Semiconductor device analysis SHLs/SHL version: Magnetic materials, EBSD, biology (areitomography, CLEM)
