JSM-IT510 InTouchScope Scanning Electron Microscope
The observation work of SEM has become more efficient and easier to perform.
Japan Electron Optics Corporation JSM-IT510 InTouchScope Scanning Electron Microscope The Scanning Electron Microscope (SEM) has become an essential tool not only for research but also for quality assurance and manufacturing environments. In such settings, it is necessary to repeatedly perform the same observation tasks, leading to a demand for process efficiency. The JSM-IT510, with its newly added Simple SEM function, allows for more efficient and easier SEM observation tasks. 〇Features - Simple SEM: Just select the field of view you want to capture - Safe and easy! Sample exchange guidance - Zeromag: Magnifying the optical image reveals the SEM image - Live Analysis / Live Map: Continuous elemental analysis during observation - Comprehensive features *For more details, please download the PDF or feel free to contact us.
basic information
【Specifications】 The JSM-IT510 Series has four types. - BU (Base Unit) A basic type that allows observation under high vacuum. - A (Analysis) A standard analysis type equipped with an Energy Dispersive X-ray Spectroscopy (EDS) system for analysis. - LV (Low Vacuum) A low vacuum type (up to 650 Pa) equipped with a Backscattered Electron Detector (BED) for observation. - LA (Low Vacuum & Analysis) A low vacuum analysis type equipped with both BED and EDS. *For more details, please refer to the PDF or feel free to contact us.
Price information
Please contact us.
Price range
P7
Delivery Time
OTHER
There may be fluctuations depending on the delivery area, so please feel free to contact us.
Model number/Brand name
JSM-IT510 InTouchScope
Applications/Examples of results
【Applications】 Metal materials, semiconductor materials, soft materials / polymer materials, biological samples.
