JIB-PS500i FIB-SEM system
Cutting-edge technologies for sample preparation, observation, and analysis.
Japan Electron Co., Ltd. JIB-PS500i offers three solutions to assist in TEM sample preparation. You can work with a reliable and high-throughput workflow from sample preparation to TEM observation. 〇 Features - The dual-axis tilt cartridge and TEM holder facilitate the link between TEM and FIB. - The cartridge can be easily attached to a dedicated TEM sample holder with one touch. - Accurate and rapid pickup operations are possible. - Seamlessly transition from TEM sample preparation to STEM observation. - The automatic TEM sample preparation system STEMPLING2 automates TEM sample preparation. *For more details, please download the PDF or feel free to contact us.
basic information
【Specifications】 ■SEM Image resolution: 0.7 nm (15 kV), 1.4 nm (1 kV), 1.0 nm (1 kV, BD mode) Magnification: ×50 to ×1,000,000 (STD mode), ×1,000 to ×1,000,000 (UHR mode) ×10 to ×19,000 (LDF mode) (when displaying photo size of 128 mm × 96 mm) ■FIB Image resolution: 3 nm (at 30 kV) Magnification: ×50 to ×300,000 (limited by acceleration voltage) *For more details, please refer to the PDF or feel free to contact us.
Price information
Please contact us.
Delivery Time
Model number/Brand name
JIB-PS500i
Applications/Examples of results
【Purpose】 Sample preparation, TEM observation
