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Dry SD Windowless EDS

JSM-IT800 / A new exploration with windowless EDS analysis.

The Japan Electronics Corporation's Dry SD Windowless EDS Gather-X JED series is a windowless type EDS that can be mounted on the JSM-IT800. It enables stress-free EDS analysis from light elements to heavy elements! With carbon neutrality leading the way, material development has become increasingly important. For example, in battery materials, a wide range of analysis is required from light elements like Li to transition metals such as Ni, Co, and Mn. There is a growing need for more efficient and highly sensitive analysis of characteristic X-rays for the analysis of semiconductor materials and nanoparticles in catalysts. 〇 Features - High-sensitivity analysis across all energy ranges - High spatial resolution mapping - User-friendly and safe operation *For more details, please download the PDF or feel free to contact us.

basic information

【Specifications and Options】 Detectable Elements: Li to U Energy Resolution: Below 129 eV (Mn-Kα), Below 59 eV (C-Kα) Detector Type: SDD Type Detector Area: 100 mm² Applicable Incident Voltage: Below 30 kV *For more details, please refer to the PDF or feel free to contact us.

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Model number/Brand name

Gather-X JED Series

Applications/Examples of results

【Purpose】 EDS analysis

Gather-X JED Series Dry SD Windowless EDS

PRODUCT

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