Electron Probe Microanalyzer (EPMA)
You can obtain more detailed measurement results than those obtained with the energy-dispersive detector (EDS) used in a scanning electron microscope (SEM).
Japan Electronics Co., Ltd. JXA-iSP100 Electron Probe Micro Analyzer (EPMA) enables observation of surface structure and morphology as well as localized trace element analysis. It is an integrated EPMA that has evolved further to perform operations from observation to analysis more efficiently. We are the world's only manufacturer capable of offering soft X-ray spectrometers. 〇Features - Auto-loading ensures secure loading of the holder! Quickly discover the area you want to observe! - Leave all the troublesome settings to the easy EPMA for immediate element analysis. - Efficient calibration with 18 types of built-in calibration samples. *For more details, please download the PDF or feel free to contact us.
basic information
【Specifications】 Analysis Element Range WDS: Be/B to U EDS: Be to U *For details, please refer to the PDF or feel free to contact us.
Price information
Please contact us regarding the price.
Price range
P9
Delivery Time
OTHER
Delivery areas may vary, so please contact us for more information.
Model number/Brand name
JXA-iSP100
Applications/Examples of results
【Purpose】 Local trace element analysis
