アズサイエンス 松本本社 Official site

In various fields such as the semiconductor industry, polymer material development and research, and quality control!

Introduction of recommended electron microscopes, photoelectron spectrometers, and internal oblique compound microscopes by Azusa Science.

We would like to introduce three recommended products from Azusa Science. ◆ JEOL Ltd. JEM-1400Flash Electron Microscope This transmission electron microscope features a high-sensitivity sCMOS camera, an ultra-wide field montage system, and an enhanced linking function between optical microscope images and electron microscope images. It is utilized across a wide range of fields, including biology, nanotechnology, polymers, and advanced materials. ◆ JEOL Ltd. JPS-9030 X-ray Photoelectron Spectroscopy (XPS) System Equipped with a Kaufman-type etching ion source and twin anodes as standard, this versatile XPS system also offers extensive expandability with high-temperature heating systems and gas cluster ion sources. It is widely used from universities to factories as a highly versatile analytical method in material research and development, as well as in quality control. ◆ Nikon Solutions Co., Ltd. Internal Oblique Stereo Microscope SMZ445/460 This stereo zoom microscope series from Nikon boasts excellent optical performance similar to that of their cutting-edge models. It is suitable for inspecting and observing resin molded products and metal processed parts. It meets the needs for component inspection and quality control.

Related Link - https://premium.ipros.jp/azscience/

basic information

【Specifications】 ◆JEM-1400Flash Electron Microscope Resolution: 0.2 nm (HC) 0.14 nm (HR) Acceleration Voltage: 10-120 kV Magnification: ×10 to ×1,200,000 (HC), ×10 to ×1,500,000 (HR) ◆JPS-9030 X-ray Photoelectron Spectroscopy (XPS) Sensitivity (Mg Kα, 300W equivalent): Over 1,000,000 cps (at Ag 3d5/2 half-width of 1.0 eV) X-ray Source: Maximum 12kV, 50mA, Mg/Al twin target Incident Lens: 3-stage cylindrical electrostatic lens ◆Inverted Stereomicroscope SMZ445/460 Optical System: Inverted Stereomicroscope (Zoom Variable Magnification) Eyepiece Lens: Z445 E10×B (Field Number 21), Z445 E15×B (Field Number 14), Z445 E20×B (Field Number 12) Auxiliary Objective Lenses: SM AL0.5x (Working Distance 181mm), SM AL0.7x (Working Distance 127.5mm)

Price range

Delivery Time

Applications/Examples of results

For details on features and specifications, please visit the product page on the special website or download the PDF for more information. We also welcome any inquiries you may have. In addition, there are many other products listed, so please check the special website.

JEM-1400Flash Electron Microscope

PRODUCT

JPS-9030 Photoelectron Spectroscopy Device (XPS)

PRODUCT

Stereo Microscope SMZ445/460

PRODUCT

Distributors

Recommended products