JSM-IT210 Scanning Electron Microscope
It is a new generation SEM that is compact and capable of unmanned operation.
The JSM-IT210 scanning electron microscope from JEOL Ltd. is the most compact scanning electron microscope among JEOL's benchtop models. The newly developed stage features all five axes driven by motors, allowing for safer and faster operation. ○ Features - "Sample Exchange Navigation" for easy observation after inserting the sample - "Zeromag" for magnifying optical images into SEM images - "Live Analysis" for continuous elemental analysis during observation - "Simple SEM" for a variety of automatic measurements - Functions that strongly support automatic measurements - Faster analysis - Standard equipped with a 60 mm² large-diameter EDS *For more details, please refer to the PDF or feel free to contact us.
basic information
【Specifications】 Resolution High vacuum mode: 3.0nm (30kV), 15.0nm (1.0kV) Low vacuum mode: 4.0nm (30kV BED) Magnification: ×5 to ×300,000 (magnification defined for a display size of 128 × 96mm) Display magnification: ×15 to ×883,652 (using a standard monitor in full-screen display) *For more details, please refer to the PDF or feel free to contact us.
Price information
Please contact us.
Delivery Time
Model number/Brand name
JSM-IT210
Applications/Examples of results
【Applications】 Utilized in various fields such as nanotechnology, metals, semiconductors, ceramics, and medicine/biology.
