JSM-IT710HR Scanning Electron Microscope
Because I can see it, I want to pursue it.
JEOL Ltd. JSM-IT710HR Scanning Electron Microscope In addition to its resolution and analytical performance at the nanometer scale, throughput during data acquisition is also important. The newly developed JSM-IT710HR is a fourth-generation model in JEOL's HR series, themed "Anyone can easily capture high-resolution images with SEM." It features enhanced operability with expanded automatic functions and improved observation performance with a new detector system. ○ Features - SEM images are visible in conjunction with optical images - High-resolution electron gun for better visibility - Automatic measurement function: Simple SEM/EDS - Real-time 3D image construction: Live 3D - New low vacuum secondary electron detector LHSED - Stability of the Schottky FE electron gun enhanced to over four times compared to previous models *For more details, please refer to the PDF or feel free to contact us.
basic information
【Specifications】 Resolution High vacuum mode: 1.0nm (20kV), 3.0nm (1.0kV) During analysis: 3.0nm (15kV irradiation current 3nA) Low vacuum mode: 1.8nm (15kV BED) Magnification: ×5 to 600,000 (defined based on a display size of 128mm × 96mm) Display magnification: ×15 to 1,767,305 (defined based on a display size of 377mm × 283mm) *For more details, please refer to the PDF or feel free to contact us.
Price information
Please contact us.
Delivery Time
Model number/Brand name
JSM-IT710HR
Applications/Examples of results
【Applications】 It is widely used in the fields of nanotechnology, metals, semiconductors, ceramics, as well as in medicine and biology, ranging from basic research to manufacturing sites and quality control.
