Semiconductors, ceramics, academic research and development, observation at atomic resolution, etc.!
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Here are three products from JEOL Ltd. that can be used in various fields: 〇 JSM-IT200 InTouchScope Scanning Electron Microscope This product is designed with a focus on cost performance, making it simple and easy to use. It features a user-friendly sample exchange guide that allows beginners to easily set up samples, search for fields of view, and start observing SEM images. 〇 JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope Equipped with a cold cathode field emission gun (Cold-FEG) developed with JEOL's unique technology and a new spherical aberration corrector (ASCOR) capable of correcting higher-order aberrations, this microscope achieves atomic resolution not only at a high acceleration voltage of 200 kV but also at a low acceleration voltage of 30 kV. It also includes a system that automatically performs high-speed and accurate aberration correction. 〇 JEM-F200 Multifunctional Electron Microscope This transmission electron microscope is designed to improve spatial resolution and analytical performance while considering operability for various applications. It features a new operating system that appeals to both beginners and experienced users with its smart appearance. Developed with energy efficiency and CO2 reduction as its concept, it is a field emission type electron microscope.
basic information
〇JSM-IT200 InTouchScope Scanning Electron Microscope Zeromag allows for field searching with the feel of an optical microscope. Live Analysis provides elemental analysis results without the need for conscious analysis. SMILE VIEW Lab enables the creation of reports that combine observation and analysis. All of the above analysis software has been integrated into one. 〇JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope Resolution: STEM HAADF image 70 pm (200 kV), 100 pm (80 kV), 160 pm (30 kV) TEM information limit 100 pm (200 kV), 110 pm (80 kV), 250 pm (30 kV) Magnetic Field-Free Mode: Lorentz Magnification Setting Mode (screen ×50 to 80 k) – standard feature 〇JEM-F200 Multifunctional Electron Microscope Resolution: Ultra High-Resolution Configuration, High-Resolution Configuration Accelerating Voltage: 200, 80 kV TEM Particle Image Ultra High-Resolution Configuration: 0.19 nm High-Resolution Configuration: 0.23 nm
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Applications/Examples of results
〇JSM-IT200 InTouchScope Scanning Electron Microscope Applications: Research in nanotechnology, semiconductors, ceramics, and medical biology, etc. 〇JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope Applications: Academic research at universities, research and development, and quality control in companies. 〇JEM-F200 Multifunctional Electron Microscope Applications: Observation at atomic resolution, various elemental analysis. *For details on features and specifications, please visit the product page on the special website or download the PDF. We also welcome your inquiries. There are many other products listed, so please be sure to check the special website.
