For research in organic chemistry and materials science, as well as observations at atomic resolution!
Introduction to recommended electron microscopes, polarizing microscopes, and mass spectrometers by Azusa Science.
Here are three recommended products: ◆ JEOL Ltd. JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope Equipped with a cold field emission gun (Cold-FEG) and a new spherical aberration corrector (ASCOR) capable of correcting higher-order aberrations as standard, it enables atomic resolution observation not only at a high acceleration voltage of 200 kV but also at a low acceleration voltage of 30 kV. This makes it easier to observe materials containing light elements with clear contrast. ◆ Nikon Solutions Co., Ltd. Polarized/Dispersion Microscope ECLIPSE LV100ND POL/DS This microscope can measure the properties of asbestos, such as refractive index, birefringence, retardation, extinction angle, pleochroism, and elongation, aiding in the identification of asbestos. It allows for dispersion staining observation at a magnification of 400 times. ◆ JEOL Ltd. JMS-T100LP AccuTOF LC-Express Atmospheric Pressure Ionization Time-of-Flight Mass Spectrometer This high-throughput mass spectrometer aims for high productivity with features such as multi-ionization, robustness, and easy maintenance. It is capable of analyzing a wide range of samples from low polarity to high polarity.
basic information
【Specifications】 ◆NEOARM Atomic Resolution Analytical Electron Microscope Resolution: STEM HAADF image 70 pm (200 kV), 100 pm (80 kV), 160 pm (30 kV) TEM information limit 100 pm (200 kV), 110 pm (80 kV), 250 pm (30 kV) Accelerating voltage: 30 to 200 kV (80, 200 kV – standard, 30, 60, 120 kV – optional) ◆ECLIPSE LV100ND POL/DS Optical system: CFI60 system (infinity-corrected CF optics) Eyepiece: 10X, field number 22, CM type with crosshairs and micrometer Eyepiece graticule included Objective lenses: For polarization: CFI Achromat P 4X, P 10X, LWD P 20X, P 40X, P 100X Oil For dispersion: CFI Achromat 10X DS, CFI Plan Fluor 40X DS2 ◆Atmospheric Pressure Ionization Time-of-Flight Mass Spectrometer DART, LC-MS system, easy exchange of ColdSpray ion source is possible.
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For details on features and specifications, please visit the product page on the special site or download the PDF for more information. We also welcome any inquiries you may have. In addition, there are many other products listed, so please check the special site.
