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  Observation of substrate deformation using a 3D shape measuring machine (VR-6200)

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  Mar 02, 2026

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  Observation of tracking camera cross-section by mechanical polishing.

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  Mar 02, 2026

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  NMR analysis of liquid crystal compounds

  Technical data・examples

  Mar 02, 2026

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  Appearance observation and measurement services

  Product catalog

  Mar 02, 2026

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  Observation of CMOS image sensor cross-section by mechanical polishing.

  Technical data・examples

  Mar 02, 2026

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  Strain measurement of power module package resin.

  Technical data・examples

  Mar 02, 2026

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  Evaluation of various implementation boards

  Product catalog

  Mar 02, 2026

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  SiC wafer electrical degradation simulator

  Product catalog

  Mar 02, 2026

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  Analysis of organic-inorganic composites using FT-IR and EDX.

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  Mar 02, 2026

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  Composition analysis of LIB cathode material active substances by ICP luminescence analysis.

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  Mar 02, 2026

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  Power device failure location / Slice & View three-dimensional reconstruction

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  Mar 02, 2026

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  Optical film light transmission characteristics

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  Mar 02, 2026

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  In-chamber imaging during constant temperature and humidity testing.

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  Mar 02, 2026

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  Example of analysis of compounds at the interface between SAC solder and Ni pads.

  Technical data・examples

  Mar 02, 2026

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  Measurement of moisture absorption distortion

  Technical data・examples

  Mar 02, 2026

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  Micro FT-IR imaging measurement

  Technical data・examples

  Mar 02, 2026

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  CP processing device Arblade5000_ Wide Area Cross-section Milling

  Product catalog

  Mar 02, 2026

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  IOL testing of discrete semiconductors

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  Mar 02, 2026

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  Observation of metallic tissue through chemical treatment.

  Technical data・examples

  Mar 02, 2026

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  Micro FT-IR

  Technical data・examples

  Mar 02, 2026

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  Examples of semiconductor observation through mechanical polishing.

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  Mar 02, 2026

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  Strain measurement in thermal shock testing.

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  Mar 02, 2026

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  Evaluation of particle size of positive electrode active material

  Technical data・examples

  Mar 02, 2026

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  Cross-sectional observation of substrate-mounted components (1) to (6)

  Technical data・examples

  Mar 02, 2026

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  Cross-sectional observation of substrate-mounted components.

  Technical data・examples

  Mar 02, 2026

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  Chemical Analysis Trust Service

  Product catalog

  Mar 02, 2026

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  Observation of conductive particle shapes in COG implementation

  Technical data・examples

  Mar 02, 2026

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  Analysis case of faulty switch contacts

  Technical data・examples

  Mar 02, 2026

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  Raman UV-curable resin

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  Mar 02, 2026

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  Evaluation of pore distribution in non-woven fabric sheets

  Technical data・examples

  Mar 02, 2026

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