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[Contract Analysis] Laser Microscope (High-Precision 3D Measurement & Color Observation)
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[Contract Analysis] Laser Microscope (Observation & Measurement)
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Regarding the bonding interface of Cu wire bonding.
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[Information] Regarding the bonding interface of Cu wire bonding.
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Material evaluation using a ultra-micro hardness tester.
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Observation of cross-section processing of CCD camera module.
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[Data] Processing Damage by Mechanical Grinding Method
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[Data] Cross-sectional observation of solar cell modules
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Crack observation using a tabletop SEM (scanning electron microscope)
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[Data] Cross-sectional observation of neodymium magnets using a tabletop SEM (Scanning Electron Microscope)
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[Defective Analysis Case] X-ray Observation of AC Adapter
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Observation of fracture surfaces using SEM: crab clasp
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[Observation Case] X-ray Observation of a Toggle Switch
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Sample preparation techniques for foreign object analysis
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![[Example of analysis using EBSD] Screw](https://image.mono.ipros.com/public/catalog/image/01/5de/528966/IPROS58615879509273255652.jpeg?w=120&h=170)
![[Contract Analysis] Laser Microscope (High-Precision 3D Measurement & Color Observation)](https://image.mono.ipros.com/public/catalog/image/01/a0e/530470/IPROS03889592933300963007.jpeg?w=120&h=170)
![[Contract Analysis] Laser Microscope (Observation & Measurement)](https://image.mono.ipros.com/public/catalog/image/01/347/530471/IPROS81303909102489740286.jpeg?w=120&h=170)
![[Information] Regarding the bonding interface of Cu wire bonding.](https://image.mono.ipros.com/public/catalog/image/01/358/499323/IPROS43174235351248870533.jpeg?w=120&h=170)
![[Data] Whisker Analysis by EBSD](https://image.mono.ipros.com/public/catalog/image/01/84f/542861/IPROS77618350109179489644.jpeg?w=120&h=170)
![[Data] Processing Damage by Mechanical Grinding Method](https://image.mono.ipros.com/public/catalog/image/01/96d/550884/IPROS17088718492534409169.jpeg?w=120&h=170)
![[Data] Cross-sectional observation of solar cell modules](https://image.mono.ipros.com/public/catalog/image/01/383/550886/IPROS15102564524745461668.jpeg?w=120&h=170)
![[Data] Cross-sectional observation of neodymium magnets using a tabletop SEM (Scanning Electron Microscope)](https://image.mono.ipros.com/public/catalog/image/01/378/550891/IPROS09079143872754812245.jpeg?w=120&h=170)
![[Data] Cross-section production method](https://image.mono.ipros.com/public/catalog/image/01/cfa/550895/IPROS35597836381814234211.jpeg?w=120&h=170)
![[Defective Analysis Case] X-ray Observation of AC Adapter](https://image.mono.ipros.com/public/catalog/image/01/409/549849/IPROS70295238176529335250.jpeg?w=120&h=170)
![[Observation Case] X-ray Observation of a Toggle Switch](https://image.mono.ipros.com/public/catalog/image/01/9cc/549975/IPROS28998578668948308132.jpeg?w=120&h=170)
