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A new feature has been added to the non-contact imaging camera tool setter that monitors the condition of the tool's cutting edge on the machine, allowing for the analysis of the tool's condition based on the contrast of the tool's surface. Please check the article for more details.

We will hold an online seminar as follows. The corporate perspective on the introduction of monitoring systems is changing year by year. We will explain the monitoring systems for machine tools that are currently needed, using various case studies to discuss the changes in the industry environment, what challenges customers perceive, their expectations for monitoring systems, and the effects of their implementation. This seminar will provide insights into specific approaches for your company's introduction of monitoring systems. Date and Time: February 12, 2025 (Thursday) 14:00 - 15:00 Instructor: Monitoring System Representative, ARTIS (MARPOSS Corporation Sales Development Department) Target Audience: - Customers considering the introduction of monitoring systems who want to know the specific process leading to implementation. - Customers interested in what challenges other companies have identified that led to the introduction of monitoring systems. - Customers researching the latest trends in monitoring systems for machine tools. We sincerely look forward to your participation.

A new function for measuring tool surface wear has been added to the non-contact image analysis tool setter VTS. We propose this to customers aiming for automation in tool measurement and those struggling with tool condition management that has relied on manual handling due to the difficulty of on-machine measurement. Please take a look at the article.

Thank you very much for your continued support. We, at Marpos Co., Ltd., will be closed during the following period: Closure Period: From Saturday, December 27, 2025, to Sunday, January 4, 2026. Inquiries received during the closure period will be answered sequentially after the start of business in the new year. We apologize for any inconvenience this may cause and appreciate your understanding. Sincerely,

Our company will exhibit at "SEMICON JAPAN 2025," which will be held at Tokyo Big Sight starting from December 17, 2025 (Booth Number: E4727). At this exhibition, we will introduce semiconductor industry-specific applications and non-contact measuring instruments that contribute to the reliability of semiconductor manufacturing processes and the improvement of semiconductor performance, which are continuously evolving. We warmly invite you to visit our booth and see our offerings. <Main Exhibited Products> - Visual blade inspection system for dicing processes - Non-contact high-precision thin film measurement device (interferometry technology) - Non-contact high-precision surface shape measurement device (chromatic confocal technology) - Contact/non-contact thickness measurement gauge for controlling wafer thickness during processing (interferometry technology)