Low resistance small mapping system
Precise measurement of surface resistivity and volume resistivity unaffected by sample shape! Continuous measurement of multiple samples is also possible.
This product can precisely measure surface resistivity (Ω/□) and volume resistivity (Ω·cm) without being affected by the sample shape. Variations in the thickness and composition of conductive films, metal, and ITO thin films are immediately apparent, and it is possible to map samples up to 300mm² and perform continuous measurements of multiple samples. 【Features】 ■ Connects to the Loresta GX, allowing measurements from 10^-4 to 10^7 Ω range ■ Fully automated measurement, calculation, data processing, and 3D graph output ■ Sample size up to 300mm, with the ability to measure multiple samples ■ Measurement position settings can be done through grid input, line input, sequential input, and external coordinate data import ■ Comparator function that marks measurement points on the screen that fall outside the specified range *For more details, please refer to the PDF document or feel free to contact us.
basic information
Main Measurement Targets ■ Metals ■ ITO Thin Films ■ Conductive Coatings ■ Conductive Films and Sheets *For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
【Usage】 ■Production Technology ■Quality Control ■Research and Development *For more details, please refer to the PDF document or feel free to contact us.
