[MST Homepage] Special Feature on Organic EL Analysis Part 2 ★ Launch of New TOF-SIMS Analysis Service
一般財団法人材料科学技術振興財団 MST
MST will strongly support the development of organic EL through analysis services! We have established a measurement environment to estimate the raw materials of the stacked organic films in organic EL panels, which have become more refined due to the high resolution of pixels. Through device evaluation and degradation assessment, MST will contribute to your research and development. ★★★ Analysis cases introduced this time ★★★ - Depth analysis of organic material degradation components ~ Component evaluation of organic EL degradation layers ~ - Depth analysis of polyimide components ~ Surface modification layer evaluation of organic materials is possible ~ - Depth analysis of organic EL components ~ Evaluation of organic components in micro pixel areas ~ [This is a new service!] Thanks to the new sputtering conditions of TOF-SIMS, depth analysis can now be performed without damaging organic components. - Structural estimation of organic EL materials ~ Case study of material structure estimation using Q-Tof type LC/MS/MS ~ ******************************************* For detailed data, please see the link! *******************************************
