一般財団法人材料科学技術振興財団　MST Official site

Contact Us
A0016.jpg
打ち合わせ.jpg
セミナー.jpg

[TOF-SIMS] Time-of-Flight Secondary Ion Mass Spectrometry

A0016.jpg
A0016.jpg 打ち合わせ.jpg セミナー.jpg

[TOF-SIMS] Time-of-Flight Secondary Ion Mass Spectrometry

This is a method for structural analysis of the sample surface. Due to its sensitivity to the surface compared to other analytical devices, it is suitable for identifying organic contaminants on the very surface.

This is a method for structural analysis of sample surfaces. It is suitable for identifying organic contamination on the very surface due to its sensitivity compared to other analytical devices. Using a sputter ion source, it is possible to analyze the distribution of inorganic and organic materials in the depth direction. - Structural analysis and identification of organic and inorganic compounds are possible. - Coordination data from foreign substance inspection devices can be linked. - Qualitative analysis is possible from micron-order microforeign substances to several centimeters. - It is possible to analyze the very surface with high sensitivity. - Image analysis is possible. - Qualitative analysis of depth direction analysis is possible.

Related Link - https://www.mst.or.jp/method/tabid/128/Default.asp…

basic information

By reducing the amount of ion irradiation at one time, it becomes possible to maintain the molecular state of the surface and generate secondary ions. The obtained secondary ions are analyzed using a Time-of-Flight mass spectrometer.

Price range

Delivery Time

Applications/Examples of results

- Evaluation of components and cause investigation of discoloration areas (cloudiness, stains, etc.) and peeling areas - Qualitative analysis of residues, contaminants, and foreign substances (over several micrometers) for organic and inorganic materials - Evaluation of the outermost surface before and after treatment - Distribution evaluation of materials and additives in organic EL, organic solar cells, and polymer films - Evaluation of layer structure of metal thin films and qualitative assessment of impurities - Qualitative assessment of binders in secondary batteries, state of lithium, and degradation evaluation - Distribution evaluation of impurities and coating agents from powder surfaces - Evaluation of the penetration of chemicals into skin and hair - Evaluation of component distribution in films

Detailed information

News about this product（5）

Companynews list (225)

Distributors

Recommended products

  • [Analysis Case] LSI・Memory

[Analysis Case] Composition Analysis of Particles on a Wafer

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Qualitative Analysis of Fluorinated Gases

一般財団法人材料科学技術振興財団　MST

  • Measurement Method: Failure Analysis

Observation of structural changes in metallic materials through tensile testing using in situ X-ray CT.

一般財団法人材料科学技術振興財団　MST

  • Measurement Method: Failure Analysis

[Analysis Case] Evaluation of Metal Impurities in the Metal Film and Interface of the Device

一般財団法人材料科学技術振興財団　MST

  • [Analysis Case] Fuel Cell

Accelerating research and development, [new] surface analysis service launched!

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Simultaneous Qualitative Analysis of Inorganic and Organic Contaminants/Adhesives on Wafers

一般財団法人材料科学技術振興財団　MST

  • [Measurement Method] Other Measurement Methods

[Analysis Case] Imaging of Brain Lipids

一般財団法人材料科学技術振興財団　MST

  • [Measurement Method] Other Measurement Methods

[Analysis Case] Emission Analysis of Perovskite Solar Cells

一般財団法人材料科学技術振興財団　MST

  • [Measurement Method] Other Measurement Methods

Quantification of cellulose, hemicellulose, and lignin in wood biomass.

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Depth Direction Analysis of Components in SiON Ultra-Thin Films

一般財団法人材料科学技術振興財団　MST

  • [Measurement Method] Other Measurement Methods

[Analysis Case] Mechanical Property Evaluation Simulation Using Molecular Dynamics Calculations

一般財団法人材料科学技術振興財団　MST

  • [Measurement Method] Other Measurement Methods

[Analysis Case] Analysis of Bacteria Using DNA Analysis

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Outgassing Analysis of Resin for 3D Printers

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Impurity Evaluation of MLCC Using Diagonal Processing MLCC

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Comprehensive Evaluation of Positive Electrode Active Materials in Secondary Batteries

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Evaluation of Resistance Values and Li Distribution in Secondary Battery Cathodes

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Structural Evaluation of Secondary Battery Separators

一般財団法人材料科学技術振興財団　MST

  • Measurement Method: X-ray Diffraction Related

[Analysis Case] Evaluation of Sn Surface State by XPS

一般財団法人材料科学技術振興財団　MST

  • Measurement Method: X-ray Diffraction Related

[Analysis Case] XPS Analysis of Metal Pipe Inner Wall Using Combined Cutting Processing

一般財団法人材料科学技術振興財団　MST

  • Measurement Method: X-ray Diffraction Related

[Analysis Case] Wide-area Quantitative Mapping using XPS

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Component Analysis of Disinfectant Alcohol

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Imaging Analysis of Antimicrobial Agents on Antimicrobial Coating Surfaces

一般財団法人材料科学技術振興財団　MST

  • Measurement Method: X-ray Diffraction Related

[Analysis Case] Structural Analysis of Non-Woven Fabric Masks

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Evaluation of the Composition of Secondary Battery Electrolyte

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Component Evaluation of Positive and Negative Electrode Binders in Secondary Batteries

一般財団法人材料科学技術振興財団　MST

  • Measurement Method: X-ray Diffraction Related

[Analysis Case] Binding State Mapping by XPS

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Analysis of All-Solid-State Batteries

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

Analysis of Corrosive Gases Emitted from Resin

一般財団法人材料科学技術振興財団　MST

  • Vibrational spectroscopy

[Analysis Case] Evaluation of Curing Degree of UV-Cured Resin by FT-IR

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Qualitative and Structural Analysis of Resin (Synthetic Polymer)

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Rietveld Analysis of Secondary Battery Cathode Materials

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Composition Analysis of the Surface Film on the Positive Electrode of Secondary Batteries

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Investigation of the Causes of Yellowing in Polyurethane

一般財団法人材料科学技術振興財団　MST

  • [Measurement Method] Other Measurement Methods

[Analysis Case] Analysis of LIB Electrolyte Using Molecular Dynamics Simulation

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Evaluation of Glass Fiber Reinforced Plastic using X-ray CT and GC/MS

一般財団法人材料科学技術振興財団　MST

  • [Measurement Method] Other Measurement Methods

[Analysis Case] Simulation of Impurity Diffusion in Silicon Crystals

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Composition Analysis of UV Curing Resin

一般財団法人材料科学技術振興財団　MST

  • Measurement Method: X-ray Diffraction Related

[Analysis Case] Evaluation of the Imidization Reaction of Polyimide

一般財団法人材料科学技術振興財団　MST

  • [Measurement Method] Other Measurement Methods

[Analysis Case] Analysis of α-Alumina (α-Al2O3) by TDS

一般財団法人材料科学技術振興財団　MST

  • Measurement Method: X-ray Diffraction Related

[Analysis Case] Structural Refinement of Powdered Crystalline Materials Using Rietveld Analysis Method

一般財団法人材料科学技術振興財団　MST

  • [Measurement Method] Electron Microscopy Observation and Analysis

[Analysis Case] STEM, EBSD Image Simulation for Polycrystalline Structure Analysis

一般財団法人材料科学技術振興財団　MST

  • Measurement Method: X-ray Diffraction Related

[Analysis Case] CFRP (Carbon Fiber Reinforced Plastic) Internal Fiber Orientation Analysis

一般財団法人材料科学技術振興財団　MST

  • Measurement Method: X-ray Diffraction Related

[Analysis Case] Measurement of Partial Density of States of GaN

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Structural Analysis of Tape Adhesives by GC-MS

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Evaluation of the Component 18-MEA on Hair Surface

一般財団法人材料科学技術振興財団　MST

  • Mass spectrometry

[Analysis Case] Evaluation of Component Distribution in Skin Cross-Section

一般財団法人材料科学技術振興財団　MST