[Analysis Case] Evaluation of Interstitial Carbon in Si Substrate Using Low-Temperature PL and SIMS Analysis

It is possible to confirm the trace amounts of carbon contained in the Si substrate.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Crystal Defects in SiC Power Devices Using PL and TEM

High-resolution TEM observation of crystal defects detected by PL mapping.

last updated Mar 13, 2025

[Analysis Case] Analysis of the adhesive sheet components of the wafer

Evaluation of organic pollution's qualitative, quantitative, and distribution aspects using a combination of multiple methods.

last updated Mar 13, 2025

The influence of adsorbed oxygen in XPS.

XPS: X-ray Photoelectron Spectroscopy

last updated Mar 12, 2025

Evaluation methods for organic compounds in clean rooms

GC/MS: Gas Chromatography-Mass Spectrometry

last updated Mar 12, 2025

[Analysis Case] Stress Evaluation by Raman Mapping

It is possible to confirm the stress distribution in the sample cross-section.

last updated Mar 13, 2025

[Analysis Case] High Sensitivity Evaluation of SNDM's SiCMOS

The diffusion layer structure of SiC devices can be visualized (high-sensitivity evaluation of the diffusion layer structure).

last updated Mar 13, 2025

[Analysis Case] Non-destructive 3D Structural Observation of SiC Discrete Packages

Non-destructive three-dimensional observation of the internal structure of a discrete package.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Surface Roughness of SiC Trench MOSFET Trench Sidewalls

Quantitative evaluation of the roughness of trench sidewalls related to device characteristics.

last updated Mar 13, 2025

[Analysis Case] STEM/EDX and Image Simulation for Crystal Structure Evaluation

The evaluation of the crystal structure can be performed based on the STEM images and the results of atomic composition measurements.

last updated Mar 13, 2025

[Analysis Case] SiC by SMM and SNDM

You can evaluate the p/n polarity and carrier concentration distribution of the diffusion layer in SiC devices.

last updated Sep 18, 2025

[Analysis Case] Electronic State Evaluation of Wide Bandgap Semiconductor Dopant Site Identification

Evaluation of microscopic atomic structures is possible through computational simulation.

last updated Mar 13, 2025

[Analysis Case] Quantitative Analysis of Low Molecular Weight Siloxanes

We will quantify the siloxanes in the exhaust gas at the ng level.

last updated Mar 13, 2025

[Analysis Case] Component Analysis of Water Repellent Areas

TOF-SIMS enables wide-area imaging evaluation of multiple components.

last updated Mar 13, 2025

[Analysis Case] Depth Profile Concentration Analysis of Mg in Deep Ultraviolet LEDs

Quantification of impurities in AlGaN with various Al compositions is possible.

last updated Mar 13, 2025

Rietveld analysis refers to

Detailed information such as atomic arrangements within the crystal can be obtained from the analysis of measurement data like XRD.

last updated Mar 29, 2023

Case studies related to EV (Electric Vehicle) analysis

Analyze the EVolution of EV development!

last updated Jun 06, 2024

[Analysis Case] Evaluation of Carrier Lifetime through Photoluminescence Lifetime Measurement

Insights into the carrier lifetime of SiC can be obtained from the luminous lifetime.

last updated Mar 13, 2025

[Analysis Case] Measurement of Impurity Concentration on the Surface and Inside of SiC Substrates

Analysis of the substrate surface and interior is separated using ICP-MS and GDMS.

last updated Mar 13, 2025

[Analysis Case] Solder Wetting Test for Semiconductor Packages

It is possible to conduct solder wetting tests on electrodes after accelerated degradation testing.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Two-Dimensional Electron Gas Layer in Normally Off GaN HEMT

We can offer a one-stop solution for comprehensive analysis of product research.

last updated Mar 13, 2025

[Analysis Case] Trench-type Si-MOSFET IDSS Leakage Location Analysis

One-stop service from identifying device defects to analyzing causes.

last updated Mar 13, 2025

[Analysis Case] Surface Shape Analysis of GaN Substrates

Visualization of step-terrace structures by AFM.

last updated Mar 13, 2025

[Analysis Case] Failure Analysis of SiC Transistor using Slice & View

Check the leak path by 3D visualization of SEM images.

last updated Mar 13, 2025

[Analysis Case] Component Analysis of Leakage Areas in SiC Power Transistors

It is possible to perform magnified observation and EDX analysis at the gate destruction location identified by Slice & View.

last updated Mar 13, 2025

List of reliability tests

Reliability Test

last updated Mar 12, 2025

Evaluation avoiding duplication of Oji Peak by HAXPES.

Comparison of spectra obtained from Ga line (HAXPES) and Al line/Mg line (XPS) measurements.

last updated Mar 12, 2025

[Analysis Case] STEM, EBSD Image Simulation for Polycrystalline Structure Analysis

Evaluation of crystal forms using simulations.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Metal Impurities in the Metal Film and Interface of the Device

Impurities in films and interfaces such as plating can be evaluated using TOF-SIMS.

last updated Jul 18, 2025

[Analysis Case] Evaluation of DC Voltage Dependence of Carriers in Semiconductors

We will introduce an analysis case using Si samples with known carrier concentration!

last updated Oct 03, 2025