[Analysis Case] STEM/EDX and Image Simulation for Crystal Structure Evaluation

The evaluation of the crystal structure can be performed based on the STEM images and the results of atomic composition measurements.

last updated Apr 02, 2026

[Analysis Case] Component Analysis of Water Repellent Areas

TOF-SIMS enables wide-area imaging evaluation of multiple components.

last updated Apr 02, 2026

[Analysis Case] Depth Profile Concentration Analysis of Mg in Deep Ultraviolet LEDs

Quantification of impurities in AlGaN with various Al compositions is possible.

last updated Apr 02, 2026

List of reliability tests

Reliability Test

last updated Apr 02, 2026

[Analysis Case] STEM, EBSD Image Simulation for Polycrystalline Structure Analysis

Evaluation of crystal forms using simulations.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Metal Impurities in the Metal Film and Interface of the Device

Impurities in films and interfaces such as plating can be evaluated using TOF-SIMS.

last updated Apr 02, 2026

[Analysis Case] Evaluation of DC Voltage Dependence of Carriers in Semiconductors

We will introduce an analysis case using Si samples with known carrier concentration!

last updated Apr 02, 2026

[Analysis Case] Investigation of Product Deterioration through Weather Resistance Testing

It is possible to reproduce the deterioration state using the Sunshine Weather Meter!

last updated Apr 02, 2026

Notice of Website Renewal

To a more user-friendly and easier-to-read homepage.

last updated Apr 28, 2026

OBF STEM method (Optimal Bright Field Scanning Transmission Electron Microscopy)

OBF STEM: Optimum Bright-Field STEM Method

last updated Jun 04, 2026