[Analysis Case] STEM/EDX and Image Simulation for Crystal Structure Evaluation

The evaluation of the crystal structure can be performed based on the STEM images and the results of atomic composition measurements.

last updated Mar 13, 2025

[Analysis Case] Component Analysis of Water Repellent Areas

TOF-SIMS enables wide-area imaging evaluation of multiple components.

last updated Mar 13, 2025

[Analysis Case] Depth Profile Concentration Analysis of Mg in Deep Ultraviolet LEDs

Quantification of impurities in AlGaN with various Al compositions is possible.

last updated Mar 13, 2025

List of reliability tests

Reliability Test

last updated Mar 12, 2025

[Analysis Case] STEM, EBSD Image Simulation for Polycrystalline Structure Analysis

Evaluation of crystal forms using simulations.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Metal Impurities in the Metal Film and Interface of the Device

Impurities in films and interfaces such as plating can be evaluated using TOF-SIMS.

last updated Jul 18, 2025