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331~360 item / All 787 items
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[Analysis Case] Evaluation of Band Structure by X-ray Absorption and Emission Spectroscopy
Detailed information about the valence band, conduction band, and gap states of the material can be obtained.
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[Analysis Case] Foreign Substance Analysis on Metal Components by Raman
Measurement targeting microdomains is possible.
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[Analysis Case] Evaluation of Metal and Organic Contamination on Wafer Surface
Comprehensive evaluation based on the analysis results of multiple methods.
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[Analysis Case] D Mapping of Organic Multilayers by Raman
It is possible to confirm the distribution of components in the depth direction through surface measurements.
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[Analysis Case] Evaluation of Dental Implants Using Dynamic-SIMS
Quantitative evaluation of impurity elements is possible.
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[Analysis Case] Analysis of Fucoidan Food Standards and Specifications
MST is a designated testing organization for the JHFA standard (fucoidan food).
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[Analysis Case] Evaluation of Blood Lithium Concentration
It can be analyzed over a wide range from low concentrations to toxic levels.
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[Analysis Case] Analysis of Dehydroascorbic Acid
It is possible to analyze dehydroascorbic acid in beverages.
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Regarding interface and depth direction resolution
SIMS: Secondary Ion Mass Spectrometry
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[Analysis Case] Surface Imaging of Soft Contact Lenses in Liquid AFM
Quantitative evaluation of surface properties can be performed using AFM analysis in an aqueous solution.
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[C-SAM] Ultrasonic Microscopy Method
C-SAM is a non-destructive method for observing defects such as delamination within a sample.
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[Analysis Case] Evaluation of TOC Levels in Seawater
It is possible to analyze the TOC concentration in a solution containing salt.
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[Analysis Case] De-gassing Evaluation During Temperature Holding by TDS
You can investigate the changes in degassing intensity while maintaining the temperature.
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Evaluation methods for organic compounds in clean rooms
GC/MS: Gas Chromatography-Mass Spectrometry
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[Analysis Case] Depth Direction Analysis of XPS on the Micron (μm) Order
Depth direction analysis will be conducted to a depth of several micrometers.
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Analysis of organic acids by HPLC
HPLC: High-Performance Liquid Chromatography
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[Analysis Case] Stress Evaluation by Raman Mapping
It is possible to confirm the stress distribution in the sample cross-section.
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[Analysis Case] Valence Evaluation of Trace Metals in Ceramic Materials
It is possible to evaluate trace metals in ppm orders.
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[Analysis Case] Analysis of Hydrogen Desorption from Stainless Steel by TDS
It is possible to evaluate the amount of hydrogen released from metals using TDS (Thermogravimetric Desorption Gas Analysis).
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[Analysis Case] Evaluation of Diffusion Layer Shape of Image Sensors Using SCM
We provide consistent support from sample disassembly to measurement.
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AFM Data Collection
AFM: Atomic Force Microscopy Method
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Analysis case: Evaluation of the oxide film on the surface of solder balls.
Evaluation case of spherical shape samples
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[Analysis Case] Evaluation of Functional Groups in Graphene
Evaluation of functional groups in graphene is possible using thermal decomposition GC/MS method.
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[Analysis Case] Quantification of Diacetyl in Beverages
The amount of diacetyl can be evaluated by GC/MS.
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[Analysis Case] Comprehensive Evaluation of CMOS Sensors
Reverse engineering of smartphone components
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[Analysis Case] Evaluation of Porosity Inside Polyurethane Using X-ray CT
Analysis case of porous resin materials using X-ray CT
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[Analysis Case] AFM Analysis of Smartphone Protective Films
Quantitative evaluation of the quality of sensory products is possible.
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[Analysis Case] Evaluation of the Distribution of Drug Components Administered to the Eye
It is possible to process the eyeball and visualize the drug components (imaging).
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[Analysis Case] Verification of Reduction Treatment for Sn Oxide
Comparison of XPS and computational simulations: Analysis of electronic states from the valence band spectrum.
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[Analysis Case] Evaluation of Composition Distribution of Ultra-Thin Films Using Angle-Resolved XPS (ARXPS)
It is possible to evaluate the depth profile of ultra-thin films on the substrate.
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