All applicants will receive a gift! Basics of surface analysis and examples of contract analysis.

<XPS・TOF-SIMS> A comprehensive explanation of what surface analysis is, the types of surface analysis, and other fundamental aspects. Additionally, representative examples using surface analysis are included.

last updated Apr 02, 2026

[Analysis Case] Damage Assessment of Single Crystal Si Surface

Quantitative analysis of c-Si and a-Si by state is possible using high-resolution measurement and waveform analysis.

last updated Apr 02, 2026

[Analysis Case] High Sensitivity Evaluation of SNDM's SiCMOS

The diffusion layer structure of SiC devices can be visualized (high-sensitivity evaluation of the diffusion layer structure).

last updated Apr 02, 2026

Analysis case: Metal content analysis in a solution

High-sensitivity analysis of various solutions, such as pure water and wafer cleaning liquids, is possible.

last updated Apr 02, 2026

[Analysis Case] Non-destructive 3D Structural Observation of SiC Discrete Packages

Non-destructive three-dimensional observation of the internal structure of a discrete package.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Surface Roughness of SiC Trench MOSFET Trench Sidewalls

Quantitative evaluation of the roughness of trench sidewalls related to device characteristics.

last updated Apr 02, 2026

[Analysis Case] Hair Component Analysis

It is possible to evaluate hair components according to the purpose.

last updated Apr 02, 2026

[Analysis Case] STEM/EDX and Image Simulation for Crystal Structure Evaluation

The evaluation of the crystal structure can be performed based on the STEM images and the results of atomic composition measurements.

last updated Apr 02, 2026

[Analysis Case] SiC by SMM and SNDM

You can evaluate the p/n polarity and carrier concentration distribution of the diffusion layer in SiC devices.

last updated Apr 02, 2026

[Analysis Case] Structural Analysis of Amorphous SiNx Films Using Molecular Dynamics Calculations

Microscopic structural analysis of amorphous films is possible through simulation.

last updated Apr 02, 2026

[Analysis Case] Electronic State Evaluation of Wide Bandgap Semiconductor Dopant Site Identification

Evaluation of microscopic atomic structures is possible through computational simulation.

last updated Apr 02, 2026

[Analysis Case] Structural Analysis of DRAM Chips using TEM and SEM

Reverse engineering of DRAM on the product's internal substrate.

last updated Apr 02, 2026

[Analysis Case] Comparison of Secondary Electron Images of Cu Surface Using SEM and SIM

It is effective to differentiate between the two methods depending on the surface structure of interest.

last updated Apr 02, 2026

[Analysis Case] Observation of Crystal Grains on Cu Surface Using Scanning Ion Microscopy

It is possible to obtain insights into the size and distribution of crystal grains in metallic polycrystals.

last updated Apr 02, 2026

[Analysis Case] Three-Dimensional Structural Observation and Membrane Thickness Analysis of Seamless Capsules

Evaluation and analysis of seamless capsules is possible using X-ray CT.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Voids Inside Pancakes

Non-destructive observation of the internal structure of food using X-ray CT.

last updated Apr 02, 2026

[Analysis Case] Imaging Analysis of Pesticide Active Ingredients in Formulations

You can visualize the distribution of pesticide active ingredients and inorganic components in the formulation.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Internal State of Transistor

We evaluate abnormalities inside the device non-destructively.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Curing Degree of Epoxy Resin by FT-IR

It is possible to evaluate the degree of curing of the resin by capturing changes in functional groups.

last updated Apr 02, 2026

[Analysis Case] Non-destructive Observation of Lithium-ion Secondary Battery Internals

Case studies observed using X-ray CT.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Organic Component Desorption in a Vacuum

The temperature dependence evaluation of the desorption of specific organic components is possible through composite analysis.

last updated Apr 02, 2026

[Analysis Case] Tensile Test of Foam Rubber Using X-ray CT

Measurement and analysis of shape changes inside the sample in situ.

last updated Apr 02, 2026

[Analysis Case] TDS Analysis of Epoxy Resin

It is possible to investigate the degassing behavior of organic matter in a vacuum.

last updated Apr 02, 2026

[Analysis Case] Simultaneous Heating Analysis of Copper Plates and Solder by TDS

It is possible to evaluate degassing in an environment close to the actual process by bringing the materials into contact with each other.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Curing Degree of Polyimide Resin by FT-IR

By capturing changes in functional groups, it is possible to evaluate the imidization rate of the resin.

last updated Apr 02, 2026

[SXES] Soft X-ray Emission Spectroscopy

SXES is a method that evaluates the chemical bonding state using soft X-rays emitted from materials.

last updated Apr 02, 2026

X-ray CT method

X-ray Computed Tomography

last updated May 28, 2026

[Analysis Case] Investigation of Voids Inside Bonded Wafers Using C-SAM

We will evaluate the internal structure of the device in a comprehensive manner.

last updated Apr 02, 2026

[Analysis Case] Non-destructive Analysis of Cosmetics

The internal structure of the product can be evaluated non-destructively using X-ray CT.

last updated Apr 02, 2026

[Analysis Case] Measurement of Organic and Inorganic Carbon Content in Food

It is possible to evaluate the carbon content of organic and inorganic substances in solids.

last updated Apr 02, 2026