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391~420 item / All 737 items
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About MSDM
TOF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry
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[Analysis Case] Investigation of Degradation of Solid Polymer Fuel Cell Electrolyte Membrane
Evaluation of degradation leachate components by LC/MS and IC.
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[Analysis Case] Evaluation of Organic EL Devices Using MSDM
Visualizing the mass spectrum enables more accurate analysis.
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[Analysis Case] Evaluation of High Electron Mobility Transistors
Evaluation of crystal coherence and compositional distribution is possible with Cs collector attached STEM.
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[Analysis Case] Polarity Evaluation of GaN by ABF-STEM Observation
Atomic-level observation is possible with the Cs collector-equipped STEM.
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[Analysis Case] Qualitative Analysis of Powder Contaminants
By combining techniques, it is possible to obtain multiple types of component information.
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[Analysis Case] Evaluation of Additives in Polymer Materials Using Dissolution-Reprecipitation Method
Qualitative analysis of components using LC/MS and LC/MS/MS.
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[Analysis Case] Evaluation of Additives in Polymer Materials
Qualitative analysis of components by LC/MS.
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Differences in detected components by ionization methods ESI and APCI.
LC/MS: Liquid Chromatography-Mass Spectrometry
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[Analysis Case] Evaluation of Nickel Plating Peel-off Surface by TOF-SIMS
Investigation of the causes of coating peeling and poor adhesion through TOF-SIMS analysis.
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[Analysis Case] Thermal Desorption Gas Analysis of SiN Film by TDS
It is possible to evaluate the surface-adsorbed gas on the thin film and the desorbed gas from within the film.
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[Analysis Case] Evaluation of Carrier Distribution in Near-Infrared VCSEL Using SMM
We can consistently perform everything from disassembly and processing of the implemented product to measurement of the diffusion layer.
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[Analysis Case] Evaluation of the Diffusion Layer of SiCMOSFET Using SCM and SMM
You can evaluate the p/n polarity and carrier concentration distribution of the SiC device's diffusion layer.
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[Analysis Case] Evaluation of Organic EL Device Degradation
Suppressing changes due to processing through cutting under atmosphere control.
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[Analysis Case] Component Analysis of Organic EL Emission Layer
Possible to dismantle and preprocess while maintaining the atmosphere, up to the introduction of equipment.
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[Analysis Case] Evaluation of Layer Structure of Organic EL Devices
Preventing oxidation degradation during cutting processing under N2 atmosphere.
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[Analysis Case] Residue Analysis of Cotton Swabs with Ethanol
Analysis of stains and cleaning residues that are not visible under an optical microscope is possible using TOF-SIMS.
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[Analysis Case] Component Analysis of Aluminum Foil Surface
Evaluate the difference between glossy surfaces and matte surfaces.
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[Analysis Case] Surface Contamination Assessment of Si Wafers Stored Using TOF-SIMS
Evaluation of contamination and oxidation of Si wafers after removing the oxide film with hydrofluoric acid treatment.
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[Analysis Case] Evaluation of Odor Components in Essential Oils
Concentration analysis of odor components using solid-phase microextraction (SPME).
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[Analysis Case] Analysis of Evolved Gases during High-Temperature Heating in Air by Pyrolysis GC/MS
It is possible to track the thermal decomposition behavior in the presence of oxygen.
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[Analysis Case] Chemical Decomposition - Analysis of Polyurethane by GC/MS Method
Detailed structural analysis of condensation polymers is possible.
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Analysis of components in conductive paint.
Evaluation of the shape, composition, and dispersion state of additives in the paint due to sample cooling.
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[Analysis Case] Observation of the Interface State between Coating and Substrate
Evaluation of the coating condition on the substrate due to sample cooling.
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[Analysis Case] Evaluation of Nitrogen Components in Solution
It is possible to analyze inorganic nitrogen by form.
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Detection of trace components by P&T of volatile organic compounds (VOCs)
GC/MS: Gas Chromatography-Mass Spectrometry
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[Case Study] Development of a Simultaneous Analysis Method for Pesticides
We will develop a custom analysis method for the target component!
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Types and Characteristics of Electron Diffraction
TEM: Transmission Electron Microscopy
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[Analysis Case] Evaluation of Bonding State and Film Thickness of SiC Surface
In addition to detailed condition assessment, film thickness calculation is possible.
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Evaluation of the orientation angle of organic film materials
XAFS: X-ray Absorption Fine Structure
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