X-ray CT method
X-ray Computed Tomography
By irradiating the sample with X-rays, a two-dimensional transmission image of the internal structure of the sample is obtained. Additionally, X-ray CT (Computed Tomography) images are constructed from continuous imaging data obtained by rotating the sample. - Non-destructive, allowing for the examination of the internal structure and defect shapes of the sample. - Capable of constructing 3D images and cross-sectional images at any desired location. - X-ray energy settings can be adjusted to accommodate a wide range of subjects, from organic materials to electronic components. - X-ray CT measurements of the sample can be performed under conditions of tension/compression or cooling/heating using a dedicated stage. This document introduces application examples, principles, and data examples. For more details, please contact us.
basic information
Limit spatial resolution: 0.5 μm (Spatial resolution may vary depending on sample size and measurement field) Maximum imaging range: φ520 mm × H 650 mm Compatible sample size: Maximum φ400 mm × H1500 mm, approximately 30 kg Tube voltage: 30 kV to 450 kV Cooling/heating range: -20 ℃ to 160 ℃ (This refers to the temperature of the sample stage surface) Tensile/compressive load: Up to 5 kN Others: Various analyses (fiber orientation analysis, thickness analysis, porosity analysis, etc.) For more details, please contact us.
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Applications/Examples of results
• Observation of the internal structure of lithium-ion batteries, investigation of cracks and foreign objects • Shape evaluation and defect investigation of electronic components such as semiconductor packages • Evaluation of shape, size, and fiber orientation of carbon fiber reinforced plastic (CFRP) • Investigation of the presence of voids and foreign objects in aluminum welds • Evaluation of the shape and size of voids in urethane materials • Evaluation of granule shape, size, and filling rate in capsule formulations • Observation of fine structures inside cosmetics and confirmation of filler dispersion • Confirmation of physical analysis locations, such as identifying cross-section processing positions from transmitted images • Evaluation of product quality For more details, please contact us.
Detailed information
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Please consult with us first. ★ We will start by proposing an analysis plan ★ Meetings at your company are, of course, possible. We will carefully explain the analysis results and leave no questions unanswered. Please contact us at 03-3749-2525 or info@mst.or.jp!
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We will hold a visiting seminar. ★ We offer free seminars with engineers visiting to meet customer needs ★ We will introduce analytical techniques and explain analytical data according to customer requests. ◆ Example seminar content - A broad explanation of MST analytical methods - A detailed explanation of specific analytical methods from the principles - An explanation of the analytical data requested by the customer Please contact us at 03-3749-2525 or info@mst.or.jp!
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!























