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[Data] Precitec Presentation: Measurement Examples for Semiconductors
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[Information] Introduction to the CHRocodile Series
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Control of CMP processes and grinding processes in the semiconductor industry.
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[Information] Application examples and proposals for products related to the manufacturing process of consumer electronics.
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Data Sheet: High-Speed Full Wafer Measurement System for 12" Wafers
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Doppler wafer measurement - High-speed and high-precision measurement using a non-contact optical sensor.
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Data Sheet Spectral Interference Sensor Version 20250423
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