Notice of Participation in the 12th Non-Destructive Testing Comprehensive Exhibition

菱電湘南エレクトロニクス検査計測事業

12th Non-Destructive Testing Comprehensive Exhibition July 23 (Wednesday) - 25 (Friday), 2025, 10:00 AM - 5:00 PM Tokyo Big Sight, East Exhibition Hall Admission Fee: Free (Registration required) Organizers: Japan Non-Destructive Testing Industry Association Japan Management Association Main Exhibits New Product: Ultrasonic Flaw Detector UI-29 Portable TOFD Equipment, along with demonstrations and introductions of exhibits.

Date and time Wednesday, Jul 23, 2025 ～ Friday, Jul 25, 2025
10:00 AM ～ 05:00 PM
Capital Tokyo Big Sight East Exhibition Hall
Entry fee Free

Related product information

Digital Ultrasonic Flaw Detector 'UI-29' Latest Model
The long-awaited new product of the UI series, UI-29, supports high-speed data input and output with our latest technology, making it capable of meeting a wide range of needs.

■Standard photo function allows for hard copy of the screen ■Frequency analysis function (FFT function) is standard ■Wide range of options including image flaw detection ABC function and TOFD function ■Software version upgrade function included *For more details, please refer to the PDF document or feel free to contact us.

Return to news list