Focusing on the fields of high-speed communication, optical chips, and semiconductor wafer chip testing, we are building a complete ecosystem consisting of "measuring instruments + devices + solutions." The main product lineup is as follows: High-speed signal & optical communication measuring instruments: sampling oscilloscopes, clock recovery units, bit error rate testers (BERT), wavelength meters, high-precision source meters, etc. Optical chip testing equipment: LD (laser diode) CoC burn-in systems, bare chip testers, silicon photonics wafer test systems, etc. Semiconductor testing equipment: high-performance testing equipment such as SiC wafer burn-in test systems, SiC bare chip test and KGD (Known Good Die) sorting systems, WAT wafer parameter measurement systems, and WLR/PLR reliability test systems. Industry solutions: providing comprehensive solutions that meet industry needs, such as 1.6T optical interconnect test solutions and CPO (Co-Packaged Optics) test solutions, flexibly responding to the diversifying customer demands.

Intel, Broadcom, ON Semiconductor, Sumitomo Electric, Furukawa Electric, etc.

※Email contact: sai@semi-next.co.jp