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Precision Electronic Measurement(8)
The high-precision Source Measure Unit (SMU) integrates the functions of a voltage source, current source, voltmeter, ammeter, and electronic load into a single device, and is widely used for high-precision IV characteristic measurements. This product meets the testing and measurement needs in various industrial fields such as discrete components, solar power generation, green energy, and batteries. Semight offers a lineup of high-precision benchtop SMUs and plugin PXIe SMUs compatible with standard PXIe chassis, providing flexible and comprehensive solutions for diverse measurement scenarios.
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High-speed communication test solution(4)
As markets such as big data, cloud computing, and 5G communication rapidly develop, high-speed communication testing plays an extremely important role. **Semight** provides a variety of measurement instruments that support testing of optical transceivers and optical components. The main products are as follows: - Wideband sampling oscilloscope - NRZ/PAM4 bit error rate tester (BERT) - Burst signal compatible bit error rate tester - High-speed wavelength meter - Optical spectrum analyzer (OSA) - High-precision source measure unit (SMU) - 400G network analyzer - Optical power meter - Variable optical attenuator (VOA) - Optical switch, etc. Semight offers customers a total solution for optical communication testing with excellent cost performance.
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Optical chip test(5)
The laser burn-in test is an important method to ensure the reliability of lasers. Through testing at the stage of CoC (Chip on Carrier) or bare die, it becomes possible to screen for initial defects caused by manufacturing process issues in advance. Semight offers a complete burn-in test solution that can accommodate everything from bare die to CoC. The temperature conditions can cover a wide range, from high temperatures (over 150°C) to low temperatures (−40°C), and it is also possible to build an integrated evaluation environment equipped with a CoC automatic transport (loading and unloading) system. Semight's burn-in/transport integrated test system for laser chips has already received high praise in the market.
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Power semiconductor testing(2)
The front-end testing of semiconductors is conducted in the wafer manufacturing process to verify whether the processing parameters meet design specifications after each step, or to check for defects that may affect yield. On the other hand, back-end testing equipment is performed after wafer processing is complete, primarily aimed at conducting electrical characteristic tests to confirm whether the chip's electrical performance meets specified values. Semight provides solutions such as wafer-level burn-in systems for SiC and handlers compatible with Known Good Die (KGD), delivering clear added value to customers in the form of improved testing efficiency and reduced testing costs.
