Optical chip test
Optical chip test
The laser burn-in test is an important method to ensure the reliability of lasers. Through testing at the stage of CoC (Chip on Carrier) or bare die, it becomes possible to screen for initial defects caused by manufacturing process issues in advance. Semight offers a complete burn-in test solution that can accommodate everything from bare die to CoC. The temperature conditions can cover a wide range, from high temperatures (over 150°C) to low temperatures (−40°C), and it is also possible to build an integrated evaluation environment equipped with a CoC automatic transport (loading and unloading) system. Semight's burn-in/transport integrated test system for laser chips has already received high praise in the market.
1～5 item / All 5 items
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Inspection equipment "LD (Laser Diode) Chip Tester"
Simultaneous inspection of 2pcs LD chips under different temperature conditions! Inspection equipment compatible with DFB, EML, EML + SOA, etc. LD chips.
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LD (Laser Diode) COC Burn-In Device
Significant increase in production efficiency! You can freely set burn-in conditions for each jig, making it convenient for research and development.
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Inspection equipment "High Power LD (Laser Diode) COC Tester"
Fully automated COC inspection equipment for high-power LD (laser diode)!
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LD (Laser Diode) COC Inspection Device
The inspection jig is shared with the burn-in system! The direct inspection rate and inspection stability have significantly improved.
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High-power LD burn-in equipment
Independent control for each layer is possible! High-output laser heat dissipation with a water cooling system + TEC.
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