Inspection equipment "LD (Laser Diode) Chip Tester"
Simultaneous inspection of 2pcs LD chips under different temperature conditions! Inspection equipment compatible with DFB, EML, EML + SOA, etc. LD chips.
This product is a full test inspection equipment for LD chips that can be tested from low to high temperatures. It has two inspection stages and can simultaneously test 2 pieces of LD chips under different temperature conditions. It is compatible with LD chips such as DFB, EML, and EML + SOA. When removing chips from the blue sheet, a special method is used to avoid damaging the chips. Please feel free to contact us if you have any inquiries. 【Features】 ■ Supports inspection from low to high temperatures ■ Has two inspection stages ■ Uses a special method to avoid damaging chips when removing them from the blue sheet ■ Supports separation of 4 blue sheets and 8 bins per blue sheet after inspection *For more details, please refer to the PDF document or feel free to contact us.
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