Beam profiler compatible with large diameter and high output (infrared, detection area 50)
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Infrared-visible beam profiler with a detection area of 50mm x 50mm.
The beam profiler (beam profiler) "LaseView-LHB-NIR-GigE" is a model with a detection area of 50mm x 50mm. It also supports infrared. The large diameter, high power compatible beam profiler "LaseView-LHB" series is an unparalleled optical product that can measure the largest beams in the world. It is also used for simultaneous emission evaluation of multiple LEDs and semiconductor lasers. This single unit can be used for a wide range of applications. 【Features of the LHB Series】 - Customizable according to application - Easy measurement of beam profile and beam diameter - Capable of measuring lasers with large diameters (1 mm to 200 mm) - Capable of measuring lasers with high power (0.1 W/cm² to 100 W/cm²) - Equipped with speckle reduction functionality - Comes with M2 platform software (LaseView) for the beam profiler
basic information
Receiving surface dimensions: 50 mm × 50 mm Optical resolution: Approximately 400 μm Measurement power density reference: 0.1–100 W/cm² Incident power density: - Total incident power: 10W Allowable incident light angle: ±15° Measurement wavelength range: 950–1700 nm (1310 nm) Effective pixel count of CCD: 320 × 256 Acquired image pixel count: 400 × 400 A/D conversion resolution: 8 / 10 / 12 / 14 bit Frame rate: 228 fps Exposure time: 0.001 ms to 10 ms Interface: GigE (RJ-45) External trigger function: - Power supply: Camera power 12V, under 10W (supplied by included AC adapter) Dimensions: W195 × H83 × D196 Weight: Under 2.5 kg
Price range
Delivery Time
Model number/Brand name
LaseView-LHB-NIR-GigE
Applications/Examples of results
- Measurement of large diameter laser beam profiles - Measurement of high power laser beam profiles - Measurement of beam profiles for lasers with large beam divergence angles - Measurement of the far-field pattern (FFP) of lasers - Measurement of the near-field pattern (NFP) of lasers - Measurement of beam profiles for processing lasers - Measurement of beam profiles for laser scalpels - Evaluation measurements of LED continuous wave (CW) and pulsed emission - Evaluation measurements of semiconductor laser emission - Beam evaluation measurements of optical pickups - Measurement of the numerical aperture (NA) of optical fibers - Measurement of beam profiles, beam divergence angles, and propagation losses of lasers for satellite laser ranging systems using telescopes - Application to lens meters - Beam monitoring system for long-distance propagation lasers - Measurement of beam profiles for laser scanning units - Position measurement of scan lasers - Verification for lidar lasers - Evaluation of LiDAR - Measurement of position and beam profiles of RGB laser light sources - Verification for laser projectors
