Beam profiler compatible with large diameter and high output (wide wavelength range, light receiving area 50)
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Wide wavelength response in visible and near-infrared, beam profiler with a detection area of 50mm x 50mm.
The beam profiler "LaseView-LHB-NIR-GigE" is a model with a detection area of 50mm x 50mm. It supports a wide wavelength range from 400 to 1700nm. The "LaseView-LHB" series of beam profilers, designed for large diameter and high output, is an unparalleled optical product capable of measuring the largest beams in the world. It is also used for simultaneous emission evaluation of multiple LEDs and semiconductor lasers. This single device can be used for a wide range of applications. **Features of the LHB Series:** - Customizable according to application - Easy measurement of beam profile and beam diameter - Capable of measuring lasers with large diameters (1 mm to 200 mm) - Capable of measuring lasers with high output (0.1 W/cm² to 100 W/cm²) - Equipped with speckle reduction functionality - Comes with M2 platform software (LaseView) for the beam profiler
basic information
Receiving surface dimensions: 50 mm × 50 mm Optical resolution: Approximately 150 μm Measurement power density reference: 0.1–100 W/cm² Incident power density: - Total incident power: 10W Allowable incident light angle: ±15° Measurement wavelength range: 400–1700nm (1310nm) Effective pixel count of CCD: 1280 × 1024 Acquired image pixel count: 1250 × 1250 A/D conversion resolution: 8 / 10 / 12 bit Frame rate: 130 fps (at 8 bit) Exposure time: - Interface: GigE (RJ-45) External trigger function: - Power supply: Camera power 12V, under 10W (supplied from included AC adapter) External dimensions: W195 × H83 × D196 Weight: Under 2.5 kg
Price range
Delivery Time
Model number/Brand name
LaseView-LHB-VISNIR-GigE
Applications/Examples of results
- Measurement of large diameter laser beam profiles - Measurement of high power laser beam profiles - Measurement of beam profiles for lasers with large beam divergence angles - Measurement of the far-field pattern (FFP) of lasers - Measurement of the near-field pattern (NFP) of lasers - Measurement of beam profiles for processing lasers - Measurement of beam profiles for laser scalpels - Evaluation measurements of LED continuous wave (CW) and pulsed emission - Evaluation measurements of semiconductor laser emission - Beam evaluation measurements of optical pickups - Measurement of the numerical aperture (NA) of optical fibers - Measurement of beam profiles, beam divergence angles, and propagation losses of lasers for satellite laser ranging systems using telescopes - Application to lens meters - Beam monitoring system for long-distance propagation lasers - Measurement of beam profiles for laser scanning units - Position measurement of scanning lasers - Verification for lidar lasers - Evaluation of LiDAR - Measurement of position and beam profiles of RGB laser light sources - Verification for laser projectors
